• DocumentCode
    2144592
  • Title

    Comparative analysis and study of metastability on high-performance flip-flops

  • Author

    Li, David ; Chuang, Pierce ; Sachdev, Manoj

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
  • fYear
    2010
  • fDate
    22-24 March 2010
  • Firstpage
    853
  • Lastpage
    860
  • Abstract
    In this paper, we analyze and characterize the metastability of 11 previously proposed high-performance flip-flops, reduced clock-swing flip-flops, and level-converting flip-flops. From extensive simulation results in 65nm CMOS technology, the main metastability parameters of ¿ and T0 are extracted and analyzed at both nominal and reduced supply voltage. Our simulation results indicate that these flip-flops exhibit a wide range (up to few orders of magnitudes) of metastability windows. In particular, flip-flops with differential and positive feedback configuration such as the sense-amplifier based flip-flops demonstrate the most optimal metastability. Based on this finding, a novel pre-discharge flip-flop (PDFF) with positive feedback configuration is proposed. Extensive simulation results reveal that PDFF achieves better metastability than the previous proposed flip-flops at both nominal voltage supply and nominal voltage supply with reduced clock-swing.
  • Keywords
    CMOS integrated circuits; circuit feedback; flip-flops; clock-swing flip-flops; differential feedback; high-performance flip-flops; level-converting flip-flops; metastability; nominal voltage supply; positive feedback configuration; predischarge flip-flop; reduced supply voltage; sense-amplifier based flip-flops; Analytical models; CMOS technology; Clocks; Delay; Dynamic voltage scaling; Feedback; Flip-flops; Frequency; Metastasis; Synchronization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2010 11th International Symposium on
  • Conference_Location
    San Jose, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4244-6454-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2010.5450482
  • Filename
    5450482