Title :
Performance of variable rate bit interleaved coding for high bandwidth efficiency
Author :
Lau, Vincent K N
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ., China
Abstract :
We propose a bandwidth efficient error correction scheme, namely the variable rate adaptive bit-interleaved coded modulation (ABICM), for wireless mobile channel. The code rate and modulation level are varied according to the current channel state to exploit the time-varying nature of the wireless channel. Design challenges to achieve symbol-by-symbol adaptation and component codes design are addressed. A multi-level puncturing scheme is proposed to solve the problem of symbol-by-symbol puncturing and interleaving. The optimal adaptation thresholds are derived. It is found that there are significant gains relative to the fixed rate coding in terms of SNR and throughput. It is also found that the ABICM scheme is essentially not degraded in small interleaving depths. This makes the ABICM very suitable for real time applications
Keywords :
adaptive modulation; cellular radio; channel capacity; error correction codes; feedback; interleaved codes; modulation coding; time-varying channels; variable rate codes; ABICM; GSM; SNR; adaptive bit-interleaved coded modulation; adaptive error correction; channel state; code rate; component codes design; feedback delay; fixed rate coding; high bandwidth efficiency; interleaving depths; low capacity feedback channel; mobile radio channel; modulation level; multi-level puncturing scheme; noisy feedback; optimal adaptation thresholds; performance; real time applications; symbol-by-symbol adaptation; symbol-by-symbol puncturing; throughput; time-varying wireless channel; variable rate bit interleaved coding; variable rate modulation; Bandwidth; Degradation; Interleaved codes; Land mobile radio; Modulation coding; Performance gain; Protection; Radio transmitters; Throughput; Wireless communication;
Conference_Titel :
Vehicular Technology Conference Proceedings, 2000. VTC 2000-Spring Tokyo. 2000 IEEE 51st
Conference_Location :
Tokyo
Print_ISBN :
0-7803-5718-3
DOI :
10.1109/VETECS.2000.851633