• DocumentCode
    2144969
  • Title

    Power-yield optimization in MPSoC task scheduling under process variation

  • Author

    Momtazpour, Mahmoud ; Sanaei, Esmaeel ; Goudarzi, Maziar

  • Author_Institution
    Sharif Univ. of Technol., Tehran, Iran
  • fYear
    2010
  • fDate
    22-24 March 2010
  • Firstpage
    747
  • Lastpage
    754
  • Abstract
    Delay and leakage power uncertainty caused by process variation has become a challenging problem in deep sub-micron technologies. In recent years, the designers have developed methods to tackle this problem in many design levels such as high level synthesis and system level synthesis. This paper addresses the problem of variation-aware task scheduling and binding for multiprocessor system-on-chip (MPSoC). We consider both delay and leakage power variations during the process of finding the best schedule so that leakier processors are less utilized and can be more frequently put in sleep mode to reduce power. Our algorithm takes advantage of event tables to accelerate the statistical timing and power analysis. We use genetic algorithm to find the best schedule that maximizes power-yield under performance-yield constraint. Experimental results on a wide range of real world and random benchmarks show that our proposed algorithm achieves 47% power-yield improvement on average over deterministic worst-case-based scheduling.
  • Keywords
    genetic algorithms; multiprocessing systems; power aware computing; scheduling; statistical analysis; system-on-chip; MPSoC task scheduling; deep sub-micron technologies; genetic algorithm; high level synthesis; multiprocessor system-on-chip; performance-yield constraint; power analysis; power-yield optimization; process variation; statistical timing; system level synthesis; Acceleration; Algorithm design and analysis; Delay; Design methodology; Genetic algorithms; High level synthesis; Multiprocessing systems; Processor scheduling; Timing; Uncertainty; MPSoC; Process variation; Task scheduling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2010 11th International Symposium on
  • Conference_Location
    San Jose, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4244-6454-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2010.5450497
  • Filename
    5450497