DocumentCode :
2145019
Title :
ZnO nanorods on plastic substrate from zinc nitrate hexahydrate and hexamethylenetetramine solution
Author :
Adriyanto, Feri ; Sze, Po-Wen ; Wang, Yeong-Her
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fYear :
2008
fDate :
20-23 Oct. 2008
Firstpage :
592
Lastpage :
595
Abstract :
The control dimension and morphology in zinc oxide (ZnO) nanorods are critical issues in the fabrication of electronic and optical nanodevices. This study discusses ZnO nanorods on an ITO-laminated plastic substrate of polyethylene terephthalate. The substrate was immersed in a zinc nitrate hexahydrate Zn(NO3)2.6H2O and hexamethylenetetramine C12H6N4. solution under various deposition conditions. The X-ray diffraction pattern showed that the films were composed of ZnO and Zn(OH)2, and that the ZnO crystal had strong x-ray reflection peaks (100 and 101), in which the c-axis was parallel to the substrate. To measure the elemental composition, the empirical formula, and the chemical state, X-ray photoelectron spectroscopy were used to examine the ZnO surface; peaks belonging to Zn and O were clearly detected. A larger surface roughness was achieved after adding a 0.20 M concentration of hexamethylenetetramine. The ZnO nanorods¿ microphotograph was found at a deposition temperature of 95° C and a 2 ml volume of 0.1 M NaOH. It was also found that the crystal shows a tip-nanorod morphology with a typical diameter of 0.3 ¿m and a 3.0 ¿m rod length.
Keywords :
II-VI semiconductors; X-ray diffraction; X-ray photoelectron spectra; indium compounds; nanostructured materials; semiconductor quantum wires; semiconductor thin films; surface roughness; wide band gap semiconductors; zinc compounds; ITO-laminated plastic substrate; InSnO; X-ray diffraction pattern; X-ray photoelectron spectroscopy; ZnO; chemical state; crystal; deposition; electronic nanodevices; elemental composition; films; hexamethylenetetramine solution; microphotograph; optical nanodevices; polyethylene terephthalate; surface roughness; temperature 95 degC; tip-nanorod morphology; x-ray reflection peaks; zinc nitrate hexahydrate; Optical control; Optical device fabrication; Optical films; Plastics; Polyethylene; Rough surfaces; Surface morphology; Surface roughness; X-ray diffraction; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
Type :
conf
DOI :
10.1109/ICSICT.2008.4734608
Filename :
4734608
Link To Document :
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