DocumentCode :
2145102
Title :
Near-Threshold Voltage design in nanoscale CMOS
Author :
De, Vivek
Author_Institution :
Circuits Research Lab, Intel Corporation, USA
fYear :
2013
fDate :
18-22 March 2013
Firstpage :
612
Lastpage :
612
Abstract :
Summary form only given. New technologies have led to an “explosion” of data available to document states and processes in very many fields. Tools of data mining are being used to extract relevant information. If this information is used in decision making, analytical statistics can provide formal tests comparing the outcomes of different scenarios. Statistics has traditionally dealt with limited information, both in terms of observations and numbers of variables explaining the states of these observations. Virtually all statistical hypothesis testing was developed for such scenarios, trying to make sense from limited data, often expensive to produce. Clinical trials and the steps in development of drugs before those clinical trials are a typical examples from human medicine.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
ISSN :
1530-1591
Print_ISBN :
978-1-4673-5071-6
Type :
conf
DOI :
10.7873/DATE.2013.134
Filename :
6513580
Link To Document :
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