Title :
Multiplexed trace signal selection using non-trivial implication-based correlation
Author :
Prabhakar, Sandesh ; Hsiao, Michael S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
Abstract :
Silicon debug with a trace buffer provides real-time visibility to the design under debug. It traces a small subset of internal signals during its normal operation. The effectiveness of silicon debug, then, depends critically on the selection of trace signals. This paper proposes a new multiplexer-based trace signal interconnection scheme and a new heuristic for trace signal selection based on implication-based correlation. As a result, we can effectively trace twice as many signals with the same trace buffer width. We also propose a SAT-based heuristic to prune the selected trace signal list further to take into account those multi-node implications. Finally, we propose a state restoration algorithm for the multiplexer-based trace signal interconnection scheme. Experiments for sequential benchmark circuits showed that the proposed approach selects the trace signals effectively, giving superior restoration percentage compared with other techniques.
Keywords :
correlation methods; sequential circuits; signal restoration; silicon; SAT-based heuristic; multinode implications; multiplexed trace signal selection; multiplexer-based trace signal interconnection; nontrivial implication-based correlation; real-time visibility; sequential benchmark circuits; silicon debug; state restoration algorithm; superior restoration percentage; trace buffer; Buffer storage; Circuit testing; Clocks; Computer bugs; Integrated circuit interconnections; Integrated circuit testing; Manufacturing; Multiplexing; Signal restoration; Silicon;
Conference_Titel :
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-6454-8
DOI :
10.1109/ISQED.2010.5450503