DocumentCode
2145266
Title
Influence of Sn grain size and orientation on the thermomechanical response and reliability of Pb-free solder joints
Author
Bieler, T.R. ; Jiang, H. ; Lehman, L.P. ; Kirkpatrick, T. ; Cotts, E.J.
Author_Institution
Mater. Sci. & Chem. Eng., Michigan State Univ., East Lansing, MI
fYear
0
fDate
0-0 0
Abstract
The size and orientation of Sn grains in Pb-free, near eutectic SAC solder joints were examined. A clear dependence of the thermomechanical response of these solder joints on Sn grain orientation was observed. Solder balls with Sn grains of particular orientation (a-axis perpendicular to the substrate) were observed to fail before neighboring balls with different orientations. This results from the fact that the coefficient of thermal expansion of Sn along the a-axis is half the value along the c-axis; joints observed to be damaged had maximum mismatch in the coefficient of thermal expansion between solder and substrate at the joint interface, as well as tensile stress modes during the hot part of the cycle
Keywords
circuit reliability; grain size; soldering; solders; thermal expansion; tin alloys; Sn; eutectic SAC solder joints; grain size; lead-free solder joints; solder balls; thermomechanical reliability; thermomechanical response; Anisotropic magnetoresistance; Grain size; Lead; Materials science and technology; Microstructure; Soldering; Thermal expansion; Thermal stresses; Thermomechanical processes; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
1-4244-0152-6
Type
conf
DOI
10.1109/ECTC.2006.1645849
Filename
1645849
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