• DocumentCode
    2145266
  • Title

    Influence of Sn grain size and orientation on the thermomechanical response and reliability of Pb-free solder joints

  • Author

    Bieler, T.R. ; Jiang, H. ; Lehman, L.P. ; Kirkpatrick, T. ; Cotts, E.J.

  • Author_Institution
    Mater. Sci. & Chem. Eng., Michigan State Univ., East Lansing, MI
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    The size and orientation of Sn grains in Pb-free, near eutectic SAC solder joints were examined. A clear dependence of the thermomechanical response of these solder joints on Sn grain orientation was observed. Solder balls with Sn grains of particular orientation (a-axis perpendicular to the substrate) were observed to fail before neighboring balls with different orientations. This results from the fact that the coefficient of thermal expansion of Sn along the a-axis is half the value along the c-axis; joints observed to be damaged had maximum mismatch in the coefficient of thermal expansion between solder and substrate at the joint interface, as well as tensile stress modes during the hot part of the cycle
  • Keywords
    circuit reliability; grain size; soldering; solders; thermal expansion; tin alloys; Sn; eutectic SAC solder joints; grain size; lead-free solder joints; solder balls; thermomechanical reliability; thermomechanical response; Anisotropic magnetoresistance; Grain size; Lead; Materials science and technology; Microstructure; Soldering; Thermal expansion; Thermal stresses; Thermomechanical processes; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2006. Proceedings. 56th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0152-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2006.1645849
  • Filename
    1645849