DocumentCode
2145439
Title
Dynamic voltage (IR) drop analysis and design closure: Issues and challenges
Author
Nithin, S.K. ; Shanmugam, Gowrysankar ; Chandrasekar, Sreeram
Author_Institution
Texas Instrum. India, India
fYear
2010
fDate
22-24 March 2010
Firstpage
611
Lastpage
617
Abstract
Dynamic voltage (IR) drop, unlike the static voltage drop depends on the switching activity of the design, and hence it is vector dependent. In this paper we have highlighted the pitfalls in the common design closure methodology that addresses static IR drop well, but often fails to bound the impact of dynamic voltage drops robustly. Factors that can affect the accuracy of dynamic IR analysis and the related metrics for design closure are discussed. A structured approach to planning the power distribution and grid for power managed designs is then presented, with an emphasis to cover realistic application scenarios, and how it can be done early in the design cycle. Care-about and solutions to avoid and fix the Dynamic voltage drop issues are also presented. Results are from industrial designs in 45 nm process are presented related to the said topics.
Keywords
electric potential; integrated circuit design; network analysis; dynamic IR analysis; dynamic voltage drop analysis; size 45 nm; switching activity; Design methodology; Energy management; Power distribution; Power grids; Power system dynamics; Robustness; Switches; Switching circuits; Timing; Voltage; DvD; Dynamic IR; Dynamic voltage Drop; Peak power; Power gate; Power switch; SDF; VCD;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location
San Jose, CA
ISSN
1948-3287
Print_ISBN
978-1-4244-6454-8
Type
conf
DOI
10.1109/ISQED.2010.5450515
Filename
5450515
Link To Document