• DocumentCode
    2145458
  • Title

    Effect of stitching capacitor distance for critical traces crossing split reference planes

  • Author

    Roden, J. Alan ; Archambeault, Bruce ; Lyle, Ruthie D.

  • Author_Institution
    Aerosp. Corp., Chantilly, VA, USA
  • Volume
    2
  • fYear
    2003
  • fDate
    18-22 Aug. 2003
  • Firstpage
    703
  • Abstract
    This paper examines the EMC effect of reference plane splits in modern-day printed circuit board (PCBs). Initially, the EMC impact of the reference plane split is quantified by measuring the gap voltage which exists under a high-speed signal line which crosses a reference plane split. This is accomplished through a variety of full-wave analyses. The effect on the digital signal integrity of the transmission line is also shown. Subsequently, a novel new circuit based treatment is introduced which significantly reduces the ill effects of the discontinuity. It is also demonstrated that circuit based tools, as opposed to full-wave tools, can provide accurate analyses of these effects if the recommended discontinuity treatment is employed.
  • Keywords
    capacitors; electromagnetic compatibility; printed circuit design; EMC effect; PCB; critical traces; digital signal integrity; discontinuity treatment; gap voltage; high speed signal line; printed circuit board; reference plane splits; stitching capacitor distance; transmission line; Capacitors; Design engineering; Distributed parameter circuits; Electromagnetic compatibility; Frequency; Geometry; Power transmission lines; Printed circuits; Transmission line discontinuities; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2003 IEEE International Symposium on
  • Print_ISBN
    0-7803-7835-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2003.1236692
  • Filename
    1236692