DocumentCode :
2145458
Title :
Effect of stitching capacitor distance for critical traces crossing split reference planes
Author :
Roden, J. Alan ; Archambeault, Bruce ; Lyle, Ruthie D.
Author_Institution :
Aerosp. Corp., Chantilly, VA, USA
Volume :
2
fYear :
2003
fDate :
18-22 Aug. 2003
Firstpage :
703
Abstract :
This paper examines the EMC effect of reference plane splits in modern-day printed circuit board (PCBs). Initially, the EMC impact of the reference plane split is quantified by measuring the gap voltage which exists under a high-speed signal line which crosses a reference plane split. This is accomplished through a variety of full-wave analyses. The effect on the digital signal integrity of the transmission line is also shown. Subsequently, a novel new circuit based treatment is introduced which significantly reduces the ill effects of the discontinuity. It is also demonstrated that circuit based tools, as opposed to full-wave tools, can provide accurate analyses of these effects if the recommended discontinuity treatment is employed.
Keywords :
capacitors; electromagnetic compatibility; printed circuit design; EMC effect; PCB; critical traces; digital signal integrity; discontinuity treatment; gap voltage; high speed signal line; printed circuit board; reference plane splits; stitching capacitor distance; transmission line; Capacitors; Design engineering; Distributed parameter circuits; Electromagnetic compatibility; Frequency; Geometry; Power transmission lines; Printed circuits; Transmission line discontinuities; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7835-0
Type :
conf
DOI :
10.1109/ISEMC.2003.1236692
Filename :
1236692
Link To Document :
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