• DocumentCode
    2145831
  • Title

    Towards adaptive test of multi-core RF SoCs

  • Author

    Mittal, Rajesh ; Balasubramanian, Lakshmanan ; Kumar Y.B., Chethan ; Devanathan, V.R. ; Kawoosa, Mudasir ; Parekhji, Rubin A.

  • Author_Institution
    Texas Instruments (India) Private Limited, Bangalore, 560 093, India
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    743
  • Lastpage
    748
  • Abstract
    This paper discusses how adaptive test techniques can be applied to multi-core RF SoCs, together with design implementation and test challenges. Various techniques specific to RF circuits covering calibration trims, power management modules, co-existence issues, concurrent testing, and test measurements are explained. Results on different designs are presented. Together, they highlight the need and scope of adaptive test for RF circuits, and share a new dimension in the test of multi-core circuits, under different constraints of design, test and test equipment.
  • Keywords
    Calibration; Discrete Fourier transforms; Multicore processing; Optimization; Radio frequency; Stress; System-on-chip; Adaptive test; RF test; multi-core chips; test time optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.159
  • Filename
    6513605