Title :
Towards adaptive test of multi-core RF SoCs
Author :
Mittal, Rajesh ; Balasubramanian, Lakshmanan ; Kumar Y.B., Chethan ; Devanathan, V.R. ; Kawoosa, Mudasir ; Parekhji, Rubin A.
Author_Institution :
Texas Instruments (India) Private Limited, Bangalore, 560 093, India
Abstract :
This paper discusses how adaptive test techniques can be applied to multi-core RF SoCs, together with design implementation and test challenges. Various techniques specific to RF circuits covering calibration trims, power management modules, co-existence issues, concurrent testing, and test measurements are explained. Results on different designs are presented. Together, they highlight the need and scope of adaptive test for RF circuits, and share a new dimension in the test of multi-core circuits, under different constraints of design, test and test equipment.
Keywords :
Calibration; Discrete Fourier transforms; Multicore processing; Optimization; Radio frequency; Stress; System-on-chip; Adaptive test; RF test; multi-core chips; test time optimization;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
Print_ISBN :
978-1-4673-5071-6
DOI :
10.7873/DATE.2013.159