DocumentCode :
2145909
Title :
Post-synthesis sleep transistor insertion for leakage power optimization in clock tree networks
Author :
Homayoun, Houman ; Golshan, Shahin ; Bozorgzadeh, Eli ; Veidenbaum, Alex ; Kurdahi, Fadi J.
Author_Institution :
Center of Embedded Comput. Syst., Univ. of California, Irvine, CA, USA
fYear :
2010
fDate :
22-24 March 2010
Firstpage :
499
Lastpage :
507
Abstract :
Leakage power has grown significantly and is a major challenge in SoC design. Among SoC´s components, clock distribution network power accounts for a large portion of chip power. In this paper, we propose to deploy sleep transistor insertion (STI) in the clock tree in order to reduce leakage power. We characterize the effect of sleep transistor sharing and sizing on clock tree wakeup time, leakage power, and propagation delay. We use these characteristics during leakage power optimization. We present post synthesis sleep transistor insertion (PSSTI), a heuristic clustering algorithm for sleep transistor insertion with the objective of total power minimization in a given clock tree. Sleep transistor sharing and sizing are deployed in order to meet the clock skew and wakeup delay constraints. We explored the potential benefits of STI using a standard industrial VLSI-CAD flow including sleep-transistor insertion and routing after clock synthesis and place-and-route of the benchmark circuits. Our results show that clock tree leakage power is reduced by 19%-32% depending on the topology of the synthesized clock tree.
Keywords :
VLSI; clocks; network routing; system-on-chip; VLSI-CAD flow; clock distribution network; clock tree networks; clock tree wakeup time; heuristic clustering algorithm; leakage power optimization; place-and-route; post-synthesis sleep transistor insertion; propagation delay; sleep transistor sharing; sleep transistor sizing; system-on-chip design; wakeup delay constraints; Circuit synthesis; Clocks; Clustering algorithms; Inverters; Minimization methods; Propagation delay; Random access memory; Sleep; Threshold voltage; Timing; Clock Tree; Sleep Transistor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location :
San Jose, CA
ISSN :
1948-3287
Print_ISBN :
978-1-4244-6454-8
Type :
conf
DOI :
10.1109/ISQED.2010.5450530
Filename :
5450530
Link To Document :
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