DocumentCode
2145929
Title
Body bias driven design synthesis for optimum performance per area
Author
Meijer, Maurice ; De Gyvez, Jose Pineda
Author_Institution
NXP Semicond., Eindhoven, Netherlands
fYear
2010
fDate
22-24 March 2010
Firstpage
472
Lastpage
477
Abstract
Worst-case design uses extreme process corner conditions which rarely occur. This costs additional power due to area over-dimensioning during synthesis. We present a new design strategy for digital CMOS IP that makes use of forward body biasing. Our approach renders consistently a better performance-per-area ratio by constraining circuit over-dimensioning without sacrificing circuit performance. Dynamic power is reduced depending upon the ratio of flip-flops to logic-gates, and data activity. On a set of benchmark circuits in 65 nm LP-CMOS, we observed performance-per-area improvements up to 81%, area and leakage reductions up to 38%, and total power savings of up to 26% without performance penalties.
Keywords
CMOS integrated circuits; integrated circuit design; LP-CMOS; body bias driven design synthesis; data activity; design strategy; digital CMOS IP; dynamic power; flip-flops; forward body biasing; logic-gates; optimum performance per area; performance-per-area ratio; worst-case design; CMOS logic circuits; Circuit optimization; Circuit synthesis; Costs; Delay; Design optimization; Dynamic voltage scaling; Frequency; Process design; Timing; CMOS; area; body biasing; logic synthesis; performance;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location
San Jose, CA
ISSN
1948-3287
Print_ISBN
978-1-4244-6454-8
Type
conf
DOI
10.1109/ISQED.2010.5450531
Filename
5450531
Link To Document