Title :
A semi-canonical form for sequential AIGs
Author :
Mishchenko, Alan ; Een, Niklas ; Brayton, Robert ; Case, Michael ; Chauhan, Pankaj ; Sharma, Nikhil
Author_Institution :
Department of EECS, University of California, Berkeley, USA
Abstract :
In numerous EDA flows, time-consuming computations are repeatedly applied to sequential circuits. This motivates developing methods to determine what circuits have been processed already by a tool. This paper proposes an algorithm for semi-canonical labeling of nodes in a sequential AIG, allowing problems or sub-problems solved by an EDA tool to be cached with their computed results. This can speed up the tool when applied to designs with isomorphic components or design suites exhibiting substantial structural similarity.
Keywords :
Algorithm design and analysis; Benchmark testing; Flip-flops; Labeling; Logic gates; Refining; Runtime;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
Print_ISBN :
978-1-4673-5071-6
DOI :
10.7873/DATE.2013.169