DocumentCode :
2146200
Title :
A test sequence generation scheme satisfying the completeness criteria
Author :
Son, HongSe ; Nyang, DaeHun ; Park, JinHo ; Lim, SangYong ; Chin, ByungMoon ; Lee, JunWon ; Song, JooSeok
Author_Institution :
Electron. & Telecommun. Res. Inst., Taejeon, South Korea
Volume :
2
fYear :
1997
fDate :
20-22 Aug 1997
Firstpage :
560
Abstract :
We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we illustrate our technique on a specific example
Keywords :
automatic test software; conformance testing; fault diagnosis; finite state machines; program testing; protocols; sequences; telecommunication computing; UIO sequence; characterization sequences; completeness criteria; k-strong FSM; output fault; test sequence generation scheme; Automatic testing; Computer science; Electronic equipment testing; Fault detection; Fault tolerance; Protocols; Sections;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications, Computers and Signal Processing, 1997. 10 Years PACRIM 1987-1997 - Networking the Pacific Rim. 1997 IEEE Pacific Rim Conference on
Conference_Location :
Victoria, BC
Print_ISBN :
0-7803-3905-3
Type :
conf
DOI :
10.1109/PACRIM.1997.620325
Filename :
620325
Link To Document :
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