• DocumentCode
    2146348
  • Title

    Thermal-aware job allocation and scheduling for three dimensional chip multiprocessor

  • Author

    Liu, Shaobo ; Zhang, Jingyi ; Wu, Qing ; Qiu, Qinru

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Binghamton Univ., New York, NY, USA
  • fYear
    2010
  • fDate
    22-24 March 2010
  • Firstpage
    390
  • Lastpage
    398
  • Abstract
    In this paper, we propose a thermal-aware job allocation and scheduling algorithm for three-dimensional (3D) chip multiprocessor (CMP). The proposed algorithm assigns hot jobs to the cores close to the heat sink and cool jobs to the cores far from the heat sink, subject to thermal constraints. The direct effect of the proposed algorithm on a 3D-CMP system is that, the heat from hot jobs is removed off the chip faster than the temperature-aware methods. Therefore we are able to keep the chip cooler and in better thermal condition. Experimental results show that, comparing to the temperature-aware method, our algorithm achieves: 1) less hot spots; 2) better performance; 3) smaller temporal temperature variation; 4) lower peak temperature. The proposed algorithm reduces hot spots by more than 95% when workload contains cool jobs; and by 36% when workload does not contain cool jobs. It also boosts the system performance by 5% on average under various workloads. The temporal temperature variation is reduced by 60% and its standard deviation is decreased by 50%. In addition, the proposed algorithm achieves 1.8°C ~5°C reduction in peak temperature.
  • Keywords
    logic design; microprocessor chips; multiprocessing systems; scheduling; thermal management (packaging); 3D chip multiprocessor; cool jobs; heat sink; thermal-aware job allocation; thermal-aware scheduling; CMOS technology; Cooling; Costs; Energy management; Fabrication; Fluctuations; Packaging; Temperature distribution; Thermal engineering; Thermal management; chip multiprocessor; job allocation; scheduling; thermal management; three dimensional;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2010 11th International Symposium on
  • Conference_Location
    San Jose, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4244-6454-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2010.5450547
  • Filename
    5450547