• DocumentCode
    2146451
  • Title

    Memory evolution: Multi-functioning Unified-Random Access Memory (URAM)

  • Author

    Choi, Yang-Kyu ; Han, Jin-Woo

  • Author_Institution
    Sch. of EECS, KAIST, Daejeon, South Korea
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    831
  • Lastpage
    834
  • Abstract
    A new paradigm for silicon memory technology is proposed. A technological breakthrough that will overcome the saturation in revenue obtained from `scaling¿, a novel type of fusion memory is presented. A high-speed DRAM and non-volatile flash memory are integrated in a single memory transistor. The memory cell is named unified-random access memory (URAM), as multi-functional operation is processed in a single memory cell. The paradigm shift from `scaling¿ to `multi-function¿ will create new value and continue the evolution of silicon memory technology.
  • Keywords
    DRAM chips; elemental semiconductors; flash memories; silicon; Si; URAM operation; fusion memory; high-speed DRAM; memory evolution; multifunctioning unified-random access memory; nonvolatile flash memory; silicon memory technology; single memory cell; single memory transistor; Cost function; Ferroelectric films; FinFETs; Flash memory; Material storage; Nonvolatile memory; Packaging; Random access memory; SONOS devices; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4734671
  • Filename
    4734671