DocumentCode :
2146523
Title :
Simulation and measurement of high speed serial link performance in a dense, thin core flip chip package
Author :
Rowlands, Michael J. ; Rosser, Steven G.
Author_Institution :
Endicott Interconnect Technol., NY
fYear :
0
fDate :
0-0 0
Abstract :
The speed of differential digital signals, such as 12.5 Gb/s, have increased enough to be degraded by semiconductor packaging features which are ignored at lower frequencies. In addition, more and more signals need to communicate in and out of the die. Several multi-gigabit industry bus standards, like Hyper Transport, Infmiband, PCI Express, Rapid IO and SATA, are driving new speed and density specifications for differential signals. This paper will show how to meet these product requirements with a thin core, flip chip, organic package which uses a standard, reasonable-cost, reliable FR-4 type dielectric material
Keywords :
chip scale packaging; dielectric materials; flip-chip devices; FR-4 type dielectric material; differential digital signals; high speed serial link performance; thin core flip chip package; Dielectric materials; Flip chip; Frequency; Impedance; Performance analysis; Predictive models; Semiconductor device measurement; Semiconductor device packaging; Velocity measurement; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
1-4244-0152-6
Type :
conf
DOI :
10.1109/ECTC.2006.1645900
Filename :
1645900
Link To Document :
بازگشت