Title :
A PC-based automated guided probe testing system
Author :
Goad, Kenneth G. ; Tront, Joseph G. ; McKeeman, J.C.
Author_Institution :
Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
The physical structure of the PC-based guided probe testing system is presented. Major components of the system are shown, and a discussion of their functioning within the system is given. The guided probe algorithm that is used to locate an error is an analytic process. A typical automatic test pattern generation system will start by simulating a number of random test patterns in order to obtain expected responses and cover a percentage of possible faults. Testing strategies that provide insight into the efficient testing of printed circuit boards are discussed
Keywords :
automatic test equipment; microcomputer applications; printed circuit testing; probes; ATE; PC testing; PC-based automated guided probe testing system; automatic test pattern generation system; printed circuit boards; Algorithm design and analysis; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Error analysis; Printed circuits; Probes; System testing;
Conference_Titel :
System Theory, 1989. Proceedings., Twenty-First Southeastern Symposium on
Conference_Location :
Tallahassee, FL
Print_ISBN :
0-8186-1933-3
DOI :
10.1109/SSST.1989.72489
