DocumentCode
2146567
Title
Size reduction of electromagnetic bandgap (EBG) structures with new geometries and materials
Author
Toyota, Yoshitaka ; Engin, A. Ege ; Kim, Tae Hong ; Swaminathan, Madhavan ; Bhattacharya, Swapan
Author_Institution
Dept. of Commun. Network Eng., Okayama Univ.
fYear
0
fDate
0-0 0
Abstract
Size reduction of an electromagnetic bandgap (EBG) structure with large patches and small branches that connect adjacent patches for a power/ground plane pair is studied. To shrink the dimensions with a high isolation at the frequency of interest, this paper provides two approaches. One is a geometric approach which is to place two narrow slits on each patch. The increase of branch inductance with the long slit successfully decreases the on-set frequency of the stopband without increasing the patch size. The other approach is to use high-K material for a thin dielectric layer. In this case, the size reduction can be predicted according to a scaling law. These approaches are applied together to realize an EBG structure with the entire size of less than 20 mm on a side. It covers the GSM band with sufficient isolation. Through this study, the dispersion-diagram analysis is used to predict the stopband characteristics
Keywords
dielectric thin films; high-temperature electronics; photonic band gap; scaling circuits; EBG structure; GSM band; branch inductance; dispersion-diagram analysis; electromagnetic bandgap structures; geometric approach; high-K material; power/ground plane pair; scaling law; size reduction; stopband characteristics; thin dielectric layer; Filters; Frequency; Geometry; High K dielectric materials; High-K gate dielectrics; Lattices; Metamaterials; Passband; Periodic structures; Power engineering and energy;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
1-4244-0152-6
Type
conf
DOI
10.1109/ECTC.2006.1645901
Filename
1645901
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