Title :
Development and characterization of rigid-flex interface
Author :
Lu, Su-Tsai ; Lo, Wei-Chung ; Chen, Tai-Hong ; Chen, Yu-Hua ; Chang, Shu-Ming ; Huang, Yu-Wei ; Lee, Yuan-Chang ; Kuo, Tzu-Ying ; Shih, Ying-Ching
Author_Institution :
Adv. Packaging Technol. Center, ERSO/ITRI, Hsinchu
Abstract :
Flat panel displays (FPDs) are now getting more important role in the application of digital home and personal consumer electronics. For the future mobile application, the lack of flexibility and the decrement of weight will become the major challenges by using the glass substrate. The new choice of substrate material can provide the benefits to make the display become flexible that the current glass substrate is hard to compete with. Herein, we focused on the packaging approach by adopting the newly development technology of rigid-flex packaging by introducing flexible interconnect. There are two packaging approaches we explore the concept for flexible FPDs. One is the stretchable interconnect and the other is ultra thin die attached method. The results show we can achieve the 25% stretchable metal trace on flexible substrate, such as PU or PDMS and the resistance is keeping as low as 5 ohm/cm without any deformation. Besides, by choosing the suitable adhesives, we can also demonstrate the strong reliable interface during the bending test. The reliability test shows the intriguing structure can be applied for the flexible panel displays
Keywords :
electronics packaging; flat panel displays; flexible electronics; reliability; bending test; flat panel displays; flexible interconnect; flexible substrate; reliability test; rigid flex packaging; stretchable interconnect; stretchable metal trace; ultra thin die attached method; Consumer electronics; Electronic equipment testing; Electronics packaging; Flat panel displays; Flexible printed circuits; Glass; Gold; Integrated circuit interconnections; Integrated circuit reliability; Substrates;
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0152-6
DOI :
10.1109/ECTC.2006.1645909