• DocumentCode
    2146839
  • Title

    Effect of temperature and storage environment on the preservation of copper surfaces for fluxless soldering

  • Author

    Ebbens, Stephen ; Hutt, David A. ; Liu, Changqing

  • Author_Institution
    Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ.
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    Self-assembled monolayers of alkanethiols have been demonstrated to preserve copper surfaces for fluxless soldering. However, the performance of these coatings for electronics manufacturing will be strongly influenced by their thermal stability. For example, printed circuit boards (PCBs) may be subjected to several high temperature excursions including multiple reflows and adhesive cure. Consequently this study systematically investigates the fluxless solderability of alkanethiol coated copper after storage at a range of temperatures. It was found that while storage at elevated temperatures does reduce the coatings´ preservative properties, this effect can be reduced by decreasing the oxygen content in the surrounding atmosphere. In addition, a quantitative relationship between loss of solderability and temperature was found to exist, providing evidence for the mechanism of the loss of coating preservative properties
  • Keywords
    copper; monolayers; protective coatings; self-assembly; soldering; storage; surface structure; thermal stability; alkanethiol coated copper; coating preservative properties; copper surfaces preservation; electronics manufacturing; fluxless soldering; self-assembled monolayers; storage environment; temperature effect; thermal stability; Atmosphere; Circuit stability; Coatings; Copper; Manufacturing; Mechanical factors; Printed circuits; Soldering; Temperature distribution; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2006. Proceedings. 56th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0152-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2006.1645911
  • Filename
    1645911