DocumentCode :
2146870
Title :
Fluxless bondings of silicon to alumina substrate using electroplated eutectic Au-Sn solder
Author :
Kim, Jong Soo ; Choi, W.S. ; Shkel, Andrei ; Lee, C.C.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Irvine, CA
fYear :
0
fDate :
0-0 0
Abstract :
Large 6 mm times 9 mm silicon dice have been successfully bonded on alumina substrate with electroplated Au80Sn20 eutectic alloy. Eutectic AuSn is one of the best known hard solders having excellent fatigue-resistance and mechanical properties. A fluxless bonding process in 50 militorrs of vacuum environment is presented. Vacuum environment is employed to prevent tin oxidation during the process. The oxygen content is expected to be reduced by a factor of 15,200, comparing to bonding in air. One of the challenges in silicon-to-alumina bonding is the large mismatch in thermal expansion between silicon of 2.7 times 10-6 ppm/degC and alumina of 7 times 10 -6 ppm/degC. Electroplating method is used to build multi-layer solder. It is an economical alternative to vacuum deposition method and can produce thick solders. Joints fabricated are examined using scanning electron microscope (SEM), and energy dispersive X-ray spectroscopy (EDX). It is found that proper bonding condition is needed to turn the stacked layers into a uniform AuSn eutectic alloy. Nearly void-free joints are achieved and confirmed by a scanning acoustic microscope (SAM). To evaluate the reliability of the solder joint and the bonded structure, samples go through thermal cycling test to determine failure modes. Microstructure changes of the solder joints during thermal cycling test are also investigated
Keywords :
X-ray spectroscopy; alumina; bonding processes; electroplating; eutectic alloys; fatigue cracks; gold alloys; scanning electron microscopes; silicon; solders; thermal expansion; tin alloys; 50 mtorr; AuSn; EDX; SAM; SEM; alumina substrate bonding; electroplated eutectic alloy; electroplating; energy dispersive X-ray spectroscopy; eutectic solder; fatigue-resistance; fluxless bondings; mechanical properties; multilayer solder; scanning acoustic microscope; scanning electron microscope; silicon substrate; silicon-to-alumina bonding; thermal cycling test; thermal expansion; thick solders; vacuum deposition; void-free joints; Acoustic testing; Bonding processes; Mechanical factors; Oxidation; Power generation economics; Scanning electron microscopy; Silicon alloys; Soldering; Thermal expansion; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
1-4244-0152-6
Type :
conf
DOI :
10.1109/ECTC.2006.1645913
Filename :
1645913
Link To Document :
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