DocumentCode :
2147049
Title :
Percolation and dielectric breakdown
Author :
Kai, Wu ; Hengkun, Sie ; Jingpang, Ge
Author_Institution :
Dept. of Electr. Eng., Xi´´an Jiaotong Univ., China
Volume :
1
fYear :
1994
fDate :
3-8 Jul 1994
Firstpage :
49
Abstract :
A simple percolation model is put forward to give a qualitative analysis for intrinsic breakdown in insulating polymers. The electron´s migration in polymers should be electron hopping-conduction between localized states. When the electrical field is high enough so that electron´s hopping probability between localized states is increased to a threshold, the localized electron wave function will overlap to form a percolation path which corresponds to the extended state. Finally, breakdown will be induced by the electron multiplication process or Auger effect in the extended state
Keywords :
Bonding; Conductors; Dielectric breakdown; Electrons; Impurities; Insulation; Lattices; Polymers; Temperature; Wave functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1994., Proceedings of the 4th International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-7803-1307-0
Type :
conf
DOI :
10.1109/ICPADM.1994.413944
Filename :
413944
Link To Document :
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