• DocumentCode
    2147064
  • Title

    Er3+ absorption cross section in Si-nanocrystal waveguides in SiO2

  • Author

    Melchiorri, M. ; Daldosso, N. ; Navarre, D. ; Pavesi, L. ; Gourbilleau, F. ; Carrada, M. ; Rizk, R.

  • Author_Institution
    Dipartimento di Fisica, Trento Univ., Povo, Italy
  • fYear
    2005
  • fDate
    21-23 Sept. 2005
  • Firstpage
    120
  • Lastpage
    122
  • Abstract
    This paper reports on Er3+ absorption cross section measurement by transmission measurements in waveguide σabs measured value is 0.5-1.7 × cm at 1534 nm for all samples resulting very close to that of Er3+ in pure silica.
  • Keywords
    elemental semiconductors; erbium; nanostructured materials; optical waveguides; silicon; Er3+ absorption cross section; Si-nanocrystal waveguides; Si:Er3+; pure silica; transmission measurements; Absorption; Erbium; Face detection; Insertion loss; Light scattering; Loss measurement; Optical films; Optical scattering; Rayleigh scattering; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Group IV Photonics, 2005. 2nd IEEE International Conference on
  • Print_ISBN
    0-7803-9070-9
  • Type

    conf

  • DOI
    10.1109/GROUP4.2005.1516424
  • Filename
    1516424
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2147064