• DocumentCode
    2147141
  • Title

    Surfactant-mediated molecular-beam epitaxy of highly-strained III-V semiconductor heterostructures

  • Author

    Tournié, E. ; Ploog, K.H. ; Grandjean, N. ; Massies, J.

  • Author_Institution
    Paul-Drude-Inst. fur Festkorperelektronik, Berlin, Germany
  • fYear
    1994
  • fDate
    27-31 Mar 1994
  • Firstpage
    49
  • Lastpage
    52
  • Abstract
    The epitaxial growth of strained-layer heterostructures (SLHs) is currently under intense investigation, driven by the desire to obtain new physical properties different from those of the individual constituents of the structure. Much work is directed toward controlling the epitaxial morphology, i.e. the growth mode, of strained layers because this eventually governs the properties of SLHs. Surfactant-mediated molecular-beam epitaxy (SM-MBE) is a technique recently developed to face this challenge. We summarize the main results achieved with this approach in the field of III-V SLHs
  • Keywords
    III-V semiconductors; molecular beam epitaxial growth; semiconductor growth; semiconductor quantum wells; III-V SLHs; III-V semiconductor heterostructures; epitaxial growth; epitaxial morphology; growth mode; highly-strained; physical properties; semiconductor growth; strained layers; strained-layer heterostructures; surfactant-mediated molecular-beam epitaxy; Capacitive sensors; Delay; Gallium arsenide; III-V semiconductor materials; Lattices; Molecular beam epitaxial growth; Semiconductor films; Substrates; Tellurium; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1994. Conference Proceedings., Sixth International Conference on
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    0-7803-1476-X
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1994.328157
  • Filename
    328157