DocumentCode
2147141
Title
Surfactant-mediated molecular-beam epitaxy of highly-strained III-V semiconductor heterostructures
Author
Tournié, E. ; Ploog, K.H. ; Grandjean, N. ; Massies, J.
Author_Institution
Paul-Drude-Inst. fur Festkorperelektronik, Berlin, Germany
fYear
1994
fDate
27-31 Mar 1994
Firstpage
49
Lastpage
52
Abstract
The epitaxial growth of strained-layer heterostructures (SLHs) is currently under intense investigation, driven by the desire to obtain new physical properties different from those of the individual constituents of the structure. Much work is directed toward controlling the epitaxial morphology, i.e. the growth mode, of strained layers because this eventually governs the properties of SLHs. Surfactant-mediated molecular-beam epitaxy (SM-MBE) is a technique recently developed to face this challenge. We summarize the main results achieved with this approach in the field of III-V SLHs
Keywords
III-V semiconductors; molecular beam epitaxial growth; semiconductor growth; semiconductor quantum wells; III-V SLHs; III-V semiconductor heterostructures; epitaxial growth; epitaxial morphology; growth mode; highly-strained; physical properties; semiconductor growth; strained layers; strained-layer heterostructures; surfactant-mediated molecular-beam epitaxy; Capacitive sensors; Delay; Gallium arsenide; III-V semiconductor materials; Lattices; Molecular beam epitaxial growth; Semiconductor films; Substrates; Tellurium; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1994. Conference Proceedings., Sixth International Conference on
Conference_Location
Santa Barbara, CA
Print_ISBN
0-7803-1476-X
Type
conf
DOI
10.1109/ICIPRM.1994.328157
Filename
328157
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