DocumentCode :
2147228
Title :
Arcing through a thick B4C layer
Author :
Laux, M. ; Schneider, W. ; Hantzsche, E. ; Jüttner, B. ; Kostial, H. ; Wienhold, P.
Author_Institution :
Max-Planck-Inst. fidr Plasmaphysik, Berlin, Germany
fYear :
2002
fDate :
2002
Firstpage :
630
Lastpage :
633
Abstract :
The traces of strong erosion found on solid components covered with thick (0.17 mm) B4C-layers facing the edge of a fusion plasma are identified as relicts of arcing. Spots of light observed on the surface seem to exist during the whole lifetime of the fusion plasma (4...5s) and stay motionless despite the strong external magnetic field (B=2.3 T). The related big craters are single cylindrical holes reaching through the B4C-layer down to the Cu-substrate. In subsequent discharges the re-ignition of a new arc at the location of an old crater was found to be very probable. The interesting peculiarities of ignition and burning of arcs on B4C-layers have been confirmed in laboratory experiments (B=0.4 T) revealing that the arc current has remarkably low noise. Theoretical investigations show that a thermal runaway does not exist because of the rise of the conductivity of the semiconducting B4C with temperature. Long living arcs influence strongly the stability of the imbedding fusion plasma and the final erosion of the substrate material at the bottom of the crater holes reduces the suitability of B4C as coverage material.
Keywords :
Tokamak devices; boron compounds; electrical conductivity; plasma arc sprayed coatings; vacuum arcs; wear; 0.17 mm; B4C; B4C plasma sprayed coating; Cu-substrate; TEXTOR limiter; TEXTOR-94 tokamak; arcing relicts; conductivity; crater; crater holes; fusion plasma edge; image converter camera IMACON 468; imbedding fusion plasma; light spots; long living arcs; plasma sprayed ceramic layers; re-ignition; single cylindrical holes; solid components erosion; stability; strong external magnetic field; substrate material; thermal runaway; thick B4C layer; Fault location; Ignition; Laboratories; Magnetic fields; Plasma stability; Plasma temperature; Semiconductor materials; Solids; Surface discharges; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 2002. 20th International Symposium on
Print_ISBN :
0-7803-7394-4
Type :
conf
DOI :
10.1109/ISDEIV.2002.1027453
Filename :
1027453
Link To Document :
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