DocumentCode :
2147258
Title :
Thermal effects of moisture inducing delamination in light-emitting diode packages
Author :
Hu, Jianzheng ; Yang, Lianqiao ; Shin, Moo Whan
Author_Institution :
Dept. of Material Sci. & Eng., Myongji Univ., Kyunggi
fYear :
0
fDate :
0-0 0
Abstract :
This work reports on the moisture inducing delamination in light-emitting diode (LED) packages and its effects on thermal characteristics. The LED samples were subjected to moisture preconditioning followed by heat block testing. Transient thermal measurements were performed to investigate the thermal behavior of the delaminated LEDs. Increase of thermal resistance with the degree of delamination was observed from the transient measurement. The thermo-mechanical calculated from coupled-field FEA simulation agree well with the micro graphical evidence. The calculated hygro-mechanical stress increased with the preconditioning time. It was found that the thermo-mechanical stress plays more important role than the hygro-mechanical stress for the development of delamination in the LED packages. Moisture pre conditioning for 3 hrs and 6 hrs under 8 5timesC/8 5 RH conditions was found to make little contribution to the delamination between the chip and lead frame
Keywords :
delamination; finite element analysis; light emitting diodes; semiconductor device packaging; stress effects; thermal resistance; thermomechanical treatment; LED packages; coupled-field FEA simulation; heat block testing; hygro-mechanical stress; light-emitting diode packages; moisture inducing delamination; thermal measurements; thermal resistance; thermo-mechanical stress; transient measurement; Delamination; Electrical resistance measurement; Light emitting diodes; Moisture; Packaging; Performance evaluation; Testing; Thermal resistance; Thermal stresses; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
1-4244-0152-6
Type :
conf
DOI :
10.1109/ECTC.2006.1645928
Filename :
1645928
Link To Document :
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