• DocumentCode
    2147507
  • Title

    Noninvasive bulk dielectric testing

  • Author

    Epstein, N.R. ; Meaney, P.M. ; Golnabi, A. ; Geimer, S.D. ; Paulsen, Keith D.

  • Author_Institution
    Thayer Sch. of Eng., Dartmouth Coll., Hanover, NH, USA
  • fYear
    2012
  • fDate
    8-14 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The complex dielectric properties can be quite unique for different substances. Non-invasive microwave imaging which recovers the associated properties of commercial products could prove useful in numerous settings such as assessing the integrity of solids and testing for spoilage of food stuffs. We have adapted our microwave breast imaging system for testing arbitrarily shaped targets with varying properties. This exploits a new soft prior regularization strategy which only requires spatial geometry information along with the measured field data to reconstruct accurate property measurements of the target under test (TUT). Refining the target interface and optimizing the reconstruction code for this specific application could facilitate near real-time assessment for a range of targets.
  • Keywords
    biological organs; dielectric materials; image reconstruction; materials testing; medical image processing; microwave imaging; microwave measurement; real-time systems; TUT; accurate property measurement reconstruction; commercial products; complex dielectric properties; field data measurement; food stuffs spoilage; food stuffs testing; microwave breast imaging system; noninvasive bulk dielectric testing; noninvasive microwave imaging; real-time assessment; reconstruction code optimization; shaped targets; soft prior regularization strategy; solids integrity; spatial geometry information; target interface; target under test; Dielectrics; Image reconstruction; Microwave imaging; Microwave theory and techniques; Phantoms; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-0461-0
  • Type

    conf

  • DOI
    10.1109/APS.2012.6348820
  • Filename
    6348820