DocumentCode :
2147602
Title :
Use of experimental data in guiding thermal specification development
Author :
Joiner, Bennett ; Siegal, Bernie ; Tarter, Tom ; Bright, Bill
Author_Institution :
Motorola Inc., Austin, TX, USA
fYear :
1996
fDate :
5-7 Mar 1996
Firstpage :
65
Lastpage :
71
Abstract :
The JEDEC JC15.1 committee is developing specifications for the characterization of the thermal performance of surface mount packages for integrated circuits. This paper documents the experimental data that was used to guide the development of the Theta JA (θJA) specification. The goal is to improve the consistency of results that claim to be θJA data by tightened specifications for thermal test environments and measurement procedures as well as changes in nomenclature. Under the new JEDEC specifications, θJA will not be reported for measurements taken with the surface mount package on a multilayer printed circuit board. Measurement of θJA should be done according to JEDEC Standard EIA/JESD51-2 which requires a single layer board in a one cubic foot box under natural convection. This particular specification is only one in a series of specifications; the committee is addressing thermal characterization of packages on multilayer boards, measurements under forced convection conditions, junction to case characterization, and other specifications
Keywords :
integrated circuit packaging; measurement standards; surface mount technology; thermal variables measurement; JEDEC JC15.1 committee; JEDEC Standard EIA/JESD51-2; Theta JA; experimental data; forced convection; integrated circuit; multilayer board; natural convection; nomenclature; printed circuit board; single layer board; surface mount package; thermal measurement; thermal specification; thermal testing; Circuit testing; Electrical resistance measurement; Electronic packaging thermal management; Integrated circuit measurements; Integrated circuit packaging; Nonhomogeneous media; Round robin; Semiconductor device packaging; Surface resistance; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1996. SEMI-THERM XII. Proceedings., Twelfth Annual IEEE
Conference_Location :
Austin, TX
ISSN :
1065-2221
Print_ISBN :
0-7803-3139-7
Type :
conf
DOI :
10.1109/STHERM.1996.545093
Filename :
545093
Link To Document :
بازگشت