• DocumentCode
    2147679
  • Title

    Simulation of cable and winding response to steep-fronted voltage waves

  • Author

    Hyypio, David B.

  • Author_Institution
    Marathon Electric, Wasau, WI, USA
  • Volume
    1
  • fYear
    1995
  • fDate
    8-12 Oct 1995
  • Firstpage
    800
  • Abstract
    The detrimental effect of steep-fronted voltage waves impinging on machine windings has become a subject of concern with the advent of fast switching IGBT inverters. A simulation model using finite difference techniques has been developed which predicts observed phenomena such as machine terminal overvoltage transients and nonuniform voltage distribution within these windings. This analysis tool, unlike previous methods discussed under the background survey section of the paper, includes the feeder cable as part of the simulation to reveal the effect of its characteristic impedance and length upon the temporal machine winding voltage distribution. Simulation results are compared to actual measurements. The use of this tool in inverter waveshaping, cable selection and winding design is briefly considered
  • Keywords
    DC-AC power convertors; bipolar transistor switches; distribution networks; electric machines; finite difference methods; insulated gate bipolar transistors; invertors; machine theory; machine windings; power bipolar transistors; power cables; power semiconductor switches; power system transients; switching circuits; transient analysis; characteristic impedance; fast switching IGBT inverters; feeder cable; finite difference techniques; machine terminal overvoltage transients; machine windings; nonuniform voltage distribution; simulation model; steep-fronted voltage waves; Coils; Frequency; Impedance; Insulated gate bipolar transistors; Inverters; Machine windings; Power cables; Predictive models; Transient analysis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1995. Thirtieth IAS Annual Meeting, IAS '95., Conference Record of the 1995 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-3008-0
  • Type

    conf

  • DOI
    10.1109/IAS.1995.530381
  • Filename
    530381