Title :
Research on the propagation mechanism and loss of ridged SiGe-OI optical waveguide
Author :
Gao, Yong ; Feng, Song ; Yang, Yuan
Author_Institution :
Dept. of Electron. Eng., Xi´´an Univ. of Technol., Xi´´an, China
Abstract :
In this paper the propagation mechanism of new type ridged SiGe-OI optical waveguide has been analyzed. Using the numerical solution of effective refractive index, the effective refractive index of ridged SiGe-OI optical waveguide is calculated, and the ridged SiGe-OI optical waveguide structure parameters including the inter ridge height H, outer ridge height h, and ridge width W of waveguide are given when single-mode optical waveguide are transmitted. The model of ridged SiGe-OI optical waveguide is built and analyzed with Optiwave software, and it is verified that SiGe-OI optical waveguide has smaller transmission loss than conventional low-loss optical waveguide, it reduces the transmission losses from 0.5 dB/cm to 0.2593 dB/cm.
Keywords :
Ge-Si alloys; numerical analysis; optical waveguides; refractive index; semiconductor materials; Optiwave software; numerical solution; propagation mechanism; refractive index; single-mode optical waveguide; transmission loss; transmission loss reduction; Integrated optics; Optical interconnections; Optical losses; Optical materials; Optical propagation; Optical refraction; Optical variables control; Optical waveguides; Propagation losses; Refractive index;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
DOI :
10.1109/ICSICT.2008.4734719
