DocumentCode
2147776
Title
MOCVD growth and characterization of AlGaP/GaP/InGaP/GaP strained-layer single quantum wells
Author
Islam, M. Rabiul ; Neff, James ; Chelakara, Ram ; Dupuis, Russell D.
Author_Institution
Microelectron. Res. Center, Texas Univ., Austin, TX, USA
fYear
1994
fDate
27-31 Mar 1994
Firstpage
141
Lastpage
143
Abstract
The performance of semiconductor lasers can be significantly improved by using strained quantum wells as the active medium. A combination of biaxial strain and quantum confinement removes the valence band degeneracy at the center of the Brillouin zone and leads to anisotropy in the valence band effective masses parallel and perpendicular to the quantum well interfaces. This effect has been shown to reduce threshold current density and eliminate losses due to Auger recombination and inter-valence band absorption. AlGaP/GaP/InGaP/GaP strained layer single quantum well structures are necessary for one of the shortest wavelength light-emitting devices of the direct gap type among III-V semiconductors
Keywords
Auger effect; III-V semiconductors; aluminium compounds; chemical vapour deposition; effective mass (band structure); electron-hole recombination; gallium compounds; indium compounds; semiconductor growth; semiconductor lasers; semiconductor quantum wells; valence bands; AlGaP-GaP-InGaP-GaP; AlGaP/GaP/InGaP/GaP strained-layer single quantum wells; Auger recombination; Brillouin zone; III-V semiconductors; MOCVD growth; anisotropy; biaxial strain; direct gap; inter-valence band absorption; light-emitting devices; losses; quantum confinement; semiconductor lasers; threshold current density; valence band degeneracy; valence band effective masses; Absorption; Anisotropic magnetoresistance; Capacitive sensors; Effective mass; MOCVD; Potential well; Quantum well lasers; Radiative recombination; Semiconductor lasers; Threshold current;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1994. Conference Proceedings., Sixth International Conference on
Conference_Location
Santa Barbara, CA
Print_ISBN
0-7803-1476-X
Type
conf
DOI
10.1109/ICIPRM.1994.328181
Filename
328181
Link To Document