DocumentCode :
2147776
Title :
MOCVD growth and characterization of AlGaP/GaP/InGaP/GaP strained-layer single quantum wells
Author :
Islam, M. Rabiul ; Neff, James ; Chelakara, Ram ; Dupuis, Russell D.
Author_Institution :
Microelectron. Res. Center, Texas Univ., Austin, TX, USA
fYear :
1994
fDate :
27-31 Mar 1994
Firstpage :
141
Lastpage :
143
Abstract :
The performance of semiconductor lasers can be significantly improved by using strained quantum wells as the active medium. A combination of biaxial strain and quantum confinement removes the valence band degeneracy at the center of the Brillouin zone and leads to anisotropy in the valence band effective masses parallel and perpendicular to the quantum well interfaces. This effect has been shown to reduce threshold current density and eliminate losses due to Auger recombination and inter-valence band absorption. AlGaP/GaP/InGaP/GaP strained layer single quantum well structures are necessary for one of the shortest wavelength light-emitting devices of the direct gap type among III-V semiconductors
Keywords :
Auger effect; III-V semiconductors; aluminium compounds; chemical vapour deposition; effective mass (band structure); electron-hole recombination; gallium compounds; indium compounds; semiconductor growth; semiconductor lasers; semiconductor quantum wells; valence bands; AlGaP-GaP-InGaP-GaP; AlGaP/GaP/InGaP/GaP strained-layer single quantum wells; Auger recombination; Brillouin zone; III-V semiconductors; MOCVD growth; anisotropy; biaxial strain; direct gap; inter-valence band absorption; light-emitting devices; losses; quantum confinement; semiconductor lasers; threshold current density; valence band degeneracy; valence band effective masses; Absorption; Anisotropic magnetoresistance; Capacitive sensors; Effective mass; MOCVD; Potential well; Quantum well lasers; Radiative recombination; Semiconductor lasers; Threshold current;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1994. Conference Proceedings., Sixth International Conference on
Conference_Location :
Santa Barbara, CA
Print_ISBN :
0-7803-1476-X
Type :
conf
DOI :
10.1109/ICIPRM.1994.328181
Filename :
328181
Link To Document :
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