DocumentCode :
2147910
Title :
Instability for organic field effect transistors caused by dipole on insulator surface
Author :
Suemori, Kouji ; Taniguchi, Misuzu ; Kamata, Toshihide
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
fYear :
2008
fDate :
20-23 Oct. 2008
Firstpage :
1029
Lastpage :
1032
Abstract :
The influence of the dipole of an insulator surface on temporal changes in the source-drain current was investigated by using organic field-effect transistors with a surface-modified SiO2 insulator. The source-drain current decreased drastically with respect to time when the dipoles of the insulator surface displaced slightly. In order to obtain highly stable organic transistors, it is thus necessary to remove the mobile dipoles from the insulator surface.
Keywords :
field effect transistors; silicon compounds; SiO2; insulator surface; organic field effect transistors; source-drain current; Chemicals; Coatings; Dielectrics and electrical insulation; Fabrication; Gold; OFETs; Pentacene; Plastic insulation; Polymer films; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
Type :
conf
DOI :
10.1109/ICSICT.2008.4734728
Filename :
4734728
Link To Document :
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