Title :
Gate stack optimization to minimize power consumption in super-lattice fets
Author :
Maiorano, P. ; Gnani, Elena ; Gnudi, A. ; Reggian, S. ; Baccarani, G.
Author_Institution :
ARCES & DEI, Univ. of Bologna, Bologna, Italy
Abstract :
In this work the effect of high-k gate dielectrics on the power-speed performance of SL-FETs realized with the InGaAs/InAlAs and InGaAs/InP material pairs is investigated by numerical simulations. The analysis shows that the InGaAs/InP pair, in association with Al2O3 as the gate dielectric, provides the most promising results for high-performance applications, i.e. an on-state current approaching 2 mA/μm and an intrinsic delay lower than 0.16 ps at a supply voltage of 0.4 V. The average subthreshold swing SS is much lower than 60 mV/dec over six current decades and the point slope SS ≈ 20mV/dec. These results outperform the ITRS requirements projected to year 2022 in terms of both static and dynamic power dissipation, and make the proposed device well suited for high-performance and low-power applications at the same time.
Keywords :
III-V semiconductors; aluminium compounds; field effect transistors; gallium arsenide; high-k dielectric thin films; indium compounds; low-power electronics; numerical analysis; optimisation; Al2O3; ITRS requirements; InGaAs-InAlAs; InGaAs-InAlAs material pairs; InGaAs-InP; InGaAs-InP material pairs; SL-FET; gate stack optimization; high-k gate dielectrics; low-power applications; numerical simulations; power consumption; power dissipation; power-speed performance; subthreshold swing; super-lattice FET; voltage 0.4 V; Aluminum oxide; Delays; Dielectrics; Indium gallium arsenide; Indium phosphide; Logic gates;
Conference_Titel :
Solid-State Device Research Conference (ESSDERC), 2013 Proceedings of the European
Conference_Location :
Bucharest
DOI :
10.1109/ESSDERC.2013.6818824