DocumentCode :
2148116
Title :
Present and future prospects of gan-based power electronics
Author :
Ueda, Daisuke ; Hikita, Masahiro ; Nakazawa, Satoshi ; Nakazawa, Kazushi ; Ishida, Hidetoshi ; Yanagihara, Manabu ; Inoue, Kaoru ; Ueda, TetsllZo ; Uemoto, Y. ; Tanaka, Tsuyoshi ; Egawa, Takashi
Author_Institution :
Adavanced Technol. Res. Labs., Japan
fYear :
2008
fDate :
20-23 Oct. 2008
Firstpage :
1078
Lastpage :
1081
Abstract :
GaN/AlGaN device technologies are reviewed aiming at the applications to power switching systems. SL (Super Lattice) capping and QA (Quaternary Alloy) over-layer techniques have been developed to reduce the on-resistance of GaN/ AlGaN HFET. Further, we achieved GaN on Silicon epitaxial growth technology with almost the same mobility keeping the same 2DEG density, which will make the cost comparable to conventional Si one. The experimentally obtained RonA of the FET is 1.9 m¿cm2, which is 14 times lower than that of Si ones. Additionally, a novel approach to realize enhancement mode operation of GaN/AlGaN FET is proposed using minority carrier injection by the gate.
Keywords :
III-V semiconductors; aluminium compounds; elemental semiconductors; epitaxial growth; gallium compounds; minority carriers; power HEMT; power semiconductor switches; semiconductor superlattices; silicon; GaN-AlGaN; GaN-Si; HFET; enhancement mode operation; epitaxial growth technology; minority carrier injection; power electronics; power switching system; quaternary alloy over-layer technique; super lattice capping technique; Aluminum gallium nitride; Epitaxial growth; FETs; Gallium nitride; HEMTs; Lattices; MODFETs; Power electronics; Silicon; Switching systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
Type :
conf
DOI :
10.1109/ICSICT.2008.4734738
Filename :
4734738
Link To Document :
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