DocumentCode :
2148212
Title :
4H-SiC MESFET specially designed and fabricated for high temperature integrated circuits
Author :
Alexandru, M. ; Banu, V. ; Godignon, P. ; Vellvehi, Miquel ; Millan, James
Author_Institution :
IMB, CNM, Bellaterra, Spain
fYear :
2013
fDate :
16-20 Sept. 2013
Firstpage :
103
Lastpage :
106
Abstract :
Due to its wide bandgap, 4H-SiC is a potential candidate for developing devices capable to operate at elevated temperatures. Nowadays there is an increasing demand for high temperature circuits for drivers of SiC switches applicable to intelligent power management, automotive industry, intelligent sensors for harsh environment, space and aerospace among others. This paper is presenting high temperature experimental results in the 25°C-300°C temperature range of the 4H-SiC planar-MESFET specially designed and fabricated for high density SiC integrated circuits implementation.
Keywords :
Schottky gate field effect transistors; driver circuits; semiconductor switches; silicon compounds; wide band gap semiconductors; 4H-SiC planar-MESFET; SiC; SiC switches; aerospace; automotive industry; drivers; harsh environment; high temperature integrated circuits; intelligent power management; intelligent sensors; temperature 25 degC to 300 degC; wide bandgap; Integrated circuit modeling; Logic gates; MESFETs; SPICE; Silicon carbide; Temperature distribution; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference (ESSDERC), 2013 Proceedings of the European
Conference_Location :
Bucharest
Type :
conf
DOI :
10.1109/ESSDERC.2013.6818829
Filename :
6818829
Link To Document :
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