DocumentCode
2148500
Title
Model-based range extent for feature aided tracking
Author
Schmitz, James ; Greenewald, John
Author_Institution
Veridian Eng. Inc., Dayton, OH, USA
fYear
2000
fDate
2000
Firstpage
166
Lastpage
171
Abstract
The military is interested in tracking ground-based moving targets from standoff distances for national security and protection of assets. Air reconnaissance platforms, under normal conditions, operate at standoff distances translating to depression angles of less than 15 degrees. At these low depression angles, simple range extent models may be derived from the two-dimensional size of the target. As sensor platforms migrate to space and as this technology is used in a combat mode then models that are robust to higher depression angles are required. In this paper we discuss a model-based approach to range extent estimation using scattering centers extracted using Xpatch, a high frequency electromagnetic scattering code. This approach uses high HRR profiles generated from scattering centers to window the HRR signal to aid in the determination of the range extent and is based on the signal levels inside and outside the window (signal versus clutter). In this study we use measured HRR profile data collected at National Ground Intelligence Center (NGIC) and Xpatch synthetically generated signatures from a tank at 15 and 20 degrees depression angle
Keywords
electromagnetic wave scattering; military radar; radar clutter; radar tracking; search radar; target tracking; HRR profile data; NGIC; National Ground Intelligence Center; Xpatch; air reconnaissance platform; clutter; depression angle; feature aided tracking; ground-based moving targets; high frequency electromagnetic scattering code; military tracking; range extent estimation; range extent models; scattering centers; Electromagnetic modeling; Electromagnetic scattering; Frequency estimation; National security; Protection; Reconnaissance; Robustness; Signal generators; Space technology; Target tracking;
fLanguage
English
Publisher
ieee
Conference_Titel
Radar Conference, 2000. The Record of the IEEE 2000 International
Conference_Location
Alexandria, VA
Print_ISBN
0-7803-5776-0
Type
conf
DOI
10.1109/RADAR.2000.851824
Filename
851824
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