DocumentCode
2148559
Title
Standard resistor calibration method in measurement of noise source impedance using dual-probe approach
Author
Bo, Zhao ; Zhao Min ; Zhiming, Feng ; Yao Min
Author_Institution
Coll. of Autom. Eng., Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China
fYear
2009
fDate
16-20 Sept. 2009
Firstpage
408
Lastpage
411
Abstract
This paper presents the standard resistor sub-fitting calibration method in measurement of electromagnetic interference (EMI) noise impedance by using dual-current-probe approach. By this method, a more accurate noise source impedance and theoretical model are obtained. Experiments show this method is effective in noise impedance, and suitable for filter design.
Keywords
calibration; electric impedance measurement; electromagnetic interference; resistors; EMI noise impedance; dual-current probe approach; electromagnetic interference; filter design; noise source impedance measurement; standard resistor calibration method; sub-fitting calibration method; Calibration; Circuit noise; Electromagnetic interference; Extraterrestrial measurements; Filters; Impedance measurement; Measurement standards; Noise measurement; Probes; Resistors; dual-current-probe approach; noise source impedance; resistor calibration;
fLanguage
English
Publisher
ieee
Conference_Titel
Environmental Electromagnetics, 2009. CEEM 2009. 5th Asia-Pacific Conference on
Conference_Location
Xian
Print_ISBN
978-1-4244-4344-4
Type
conf
DOI
10.1109/CEEM.2009.5303841
Filename
5303841
Link To Document