• DocumentCode
    2148773
  • Title

    Characterization and Analyses of RadHard-by-Design CMOS Quad Operational Amplifiers

  • Author

    Benson, Ray ; Resch, Paul ; Milanowski, Randall

  • Author_Institution
    Aeroflex Inc., Plainview, NY, USA
  • fYear
    2013
  • fDate
    8-12 July 2013
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper describes total ionizing dose and single event effects data for CMOS operational amplifiers implemented using RadHard-By-Design (RHBD) design and layout techniques. i.e., edgeless nMOSFETs, fully isolating guard rings, and robust circuit topology. This work is part of Aeroflex´s larger effort to provide a complete family of radiation hardened analog function components.
  • Keywords
    CMOS integrated circuits; operational amplifiers; radiation hardening (electronics); space vehicle electronics; Aeroflex Plainview; CMOS quad operational amplifiers; RHBD layout technique; RadHard-By-Design technique; analog function component; edgeless nMOSFET; fully isolating guard rings; radiation hardening; robust circuit topology; single event effects; total ionizing dose; Bandwidth; CMOS integrated circuits; Gain; Layout; Operational amplifiers; Testing; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2013 IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4799-1136-3
  • Type

    conf

  • DOI
    10.1109/REDW.2013.6658185
  • Filename
    6658185
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2148773