Title :
Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics
Author :
Spiezia, G. ; Brugger, M. ; Danzeca, S. ; Alia, R. Garcia ; Gaillard, R. ; Fadakis, E. ; Foucard, G. ; Losito, R. ; Masi, A. ; Mekki, J. ; Oser, P. ; Peronnard, P. ; Ruggiero, G. ; Secondo, R.
Author_Institution :
Eur. Organ. for Nucl. Res. (CERN), Geneva, Switzerland
Abstract :
In the context of the CERN ´Radiation To Electronics (R2E)´ project, the vulnerability of a variety of components for particle accelerators electronics to single event effects, total ionizing dose and displacement damage has been analysed. The tested parts include analog, linear, digital, and hybrid devices and a summary of radiation test results is provided in this paper.
Keywords :
particle accelerators; radiation hardening (electronics); CERN radiation to electronics project; analog devices; candidate particle accelerator electronics; digital devices; displacement damage; hybrid devices; linear devices; radiation test; radiation-induced effects; single event effects; total ionizing dose; Large Hadron Collider; MOSFET; Neutrons; Operational amplifiers; Protons; Regulators; Voltage control;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-1136-3
DOI :
10.1109/REDW.2013.6658187
