Compendium of Total Ionizing Dose, Displacement Damage and Single Event Transient Test Data of Various Optocouplers for ESA

Author

Poizat, Marc ; Sauvagnac, Maryse ; Samaras, A. ; Padie, Yannick ; Garcia, Paulo ; Renaud, B. ; Gouyet, L. ; Abadi, Jean Paul ; Widmeer, Fabien ; Le Goulven, Enoal ; Vaille, Maxime ; Vandevelde, B. ; Caunes, Thomas ; Puybusque, Ludovic ; Vignon, Gael ; Sal

Author_Institution

Eur. Space Agency, Noordwijk, Netherlands

fYear

2013

fDate

8-12 July 2013

Firstpage

1

Lastpage

6

Abstract

We present radiation test data on optocouplers from three different vendors including results on neutron (1MeV) and proton (30, 60, 190MeV) induced displacement damage, total ionizing dose (Co60) and proton induced Single Event Transients.

Keywords

neutron effects; opto-isolators; proton effects; space vehicle electronics; transient analysis; ESA; electron volt energy 1 MeV; electron volt energy 190 MeV; electron volt energy 30 MeV; electron volt energy 60 MeV; neutron induced displacement damage; optocouplers; proton induced displacement damage; proton induced single event transients; radiation test data; single event transient test data; total ionizing dose; Degradation; Neutrons; Performance evaluation; Phototransistors; Protons; Silicon; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop (REDW), 2013 IEEE

Conference_Location

San Francisco, CA

ISSN

2154-0519

Print_ISBN

978-1-4799-1136-3

Type

conf

DOI

10.1109/REDW.2013.6658192

Filename

6658192