• DocumentCode
    2148971
  • Title

    High-ohmic resistors using nanometer-thin pure-boron chemical-vapour-deposited layers

  • Author

    Golshani, Negin ; Mohammadi, Vahid ; Ramesh, S. ; Nanver, Lis K.

  • Author_Institution
    Dept. Microelectron., Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2013
  • fDate
    16-20 Sept. 2013
  • Firstpage
    210
  • Lastpage
    213
  • Abstract
    Integrated resistors are fabricated by using pure boron (PureB) depositions to create a p-type conductive layer on n-type silicon. Sheet resistance values in the 100 kΩ/□ range are reliably and reproducibly realized. The resistors made in this material are linear and display low temperature coefficients of a few hundred ppm/°C and good tolerances.
  • Keywords
    boron; chemical vapour deposition; elemental semiconductors; monolithic integrated circuits; silicon; B; Si; high-ohmic resistors; integrated resistors; n-type silicon; nanometer-thin pure-boron chemical-vapour-deposited layers; p-type conductive layer; pure boron depositions; sheet resistance; Electrical resistance measurement; Junctions; Photodiodes; Resistance; Resistors; Silicon; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference (ESSDERC), 2013 Proceedings of the European
  • Conference_Location
    Bucharest
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2013.6818856
  • Filename
    6818856