Arbitrary function generator for APS injector synchrotron correction magnets

Author

Despe, Oscar D.

Author_Institution

Argonne Nat. Lab., IL, USA

fYear

1991

fDate

6-9 May 1991

Firstpage

1461

Abstract

The arbitrary function generator (AFG) design is based on scanning out encoded data from a semiconductor memory, a first-in-first-out (FIFO) device. The data input consists of a maximum of 20 correction values specified within the acceleration window. Additional points between these values are then linearly interpolated to create a uniformly spaced 1000 data-point function stored in the FIFO. Each point, encoded as a 3-b value is canned out in synchronism with the injection pulse and used to clock the up/down counter driving the DAC (digital-to-analog converter). The DAC produces the analog reference voltage used to control the magnet current.<>

Keywords

beam handling equipment; beam handling techniques; electron accelerators; storage rings; APS injector synchrotron correction magnets; acceleration window; analog reference voltage; arbitrary function generator; correction values; digital-to-analog converter; injection pulse; semiconductor memory; Acceleration; Clocks; Counting circuits; Magnets; Particle beams; Signal generators; Structural beams; Synchronization; Synchrotrons; Voltage control;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1991. Accelerator Science and Technology., Conference Record of the 1991 IEEE

Conference_Location

San Francisco, CA, USA

Print_ISBN

0-7803-0135-8

Type

conf

DOI

10.1109/PAC.1991.164669

Filename

164669