• DocumentCode
    2149121
  • Title

    Hardness Assurance for Total Dose and Dose Rate Testing of a State-of-the-Art Off-Shore 32 nm CMOS Processor

  • Author

    LaBel, Kenneth A. ; Gigliuto, Robert A. ; Szabo, Carl M. ; Carts, Martin A. ; Kay, M. ; Sinclair, Tony ; Gadlage, Matthew ; Duncan, A. ; Ingalls, Dave

  • Author_Institution
    NASA Goddard Space Flight Center, Greenbelt, MD, USA
  • fYear
    2013
  • fDate
    8-12 July 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Hardness assurance test results of an Advanced Micro Devices, Inc. (AMD) 32 nm processor for total dose and dose rate response are presented. Testing was performed using commercial motherboards and software stress applications versus more traditional automated test equipment (ATE).
  • Keywords
    CMOS integrated circuits; automatic test equipment; hardness testing; integrated circuit testing; radiation hardening (electronics); space vehicle electronics; AMD; ATE; advanced microdevices; automated test equipment; commercial motherboards; dose rate response; dose rate testing; hardness assurance test; off-shore CMOS processor; size 32 nm; software stress applications; Central Processing Unit; Cranes; Performance evaluation; Radiation effects; Software; Stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2013 IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4799-1136-3
  • Type

    conf

  • DOI
    10.1109/REDW.2013.6658198
  • Filename
    6658198
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2149121