• DocumentCode
    2149269
  • Title

    Run-time probabilistic detection of miscalibrated thermal sensors in many-core systems

  • Author

    Zhao, Jia ; Lu, Shiting ; Burleson, Wayne ; Tessier, Russell

  • Author_Institution
    Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, USA 01003-9284
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    1395
  • Lastpage
    1398
  • Abstract
    Many-core architectures use large numbers of small temperature sensors to detect thermal gradients and guide thermal management schemes. In this paper a technique to identify thermal sensors which are operating outside a required accuracy is described. Unlike previous on-chip temperature estimation approaches, our algorithms are optimized to run on-line while thermal management decisions are being made. The accuracy of a sensor is determined by comparing its readings to expected values from a probability distribution function determined from surrounding sensors. Experiments show that a sensor operating outside a desired accuracy can be identified with a detection rate of over 90% and an average false alarm rate of < 6%, with a confidence level of 90%. The run time of our method is shown to be around 3× lower than a recently-published temperature estimation method, enhancing its suitability for run-time implementation.
  • Keywords
    Probability distribution; System-on-chip; Temperature distribution; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.285
  • Filename
    6513731