Title :
Radiation Tolerant MESFET-CMOS Low Dropout Linear Regulator for Integrated Power Management at the 45nm Node
Author :
Thornton, Trevor J. ; Lepkowski, William ; Wilk, Seth J. ; Goryll, Michael ; Bo Chen ; Kam, Jason ; Bakkaloglu, Bertan ; Holbert, Keith
Author_Institution :
Sch. of Electr., Comput. & Energy Eng., Arizona State Univ., Tempe, AZ, USA
Abstract :
A low dropout linear regulator comprising a MESFET pass transistor with an integrated CMOS error amplifier has been fabricated using a commercial 45nm SOI foundry. Good regulation is observed after irradiation to 1 Mrad(Si).
Keywords :
CMOS integrated circuits; MESFET integrated circuits; radiation hardening (electronics); voltage regulators; MESFET pass transistor; MESFET-CMOS linear regulator; SOI foundry; integrated CMOS error amplifier; integrated power management; low dropout linear regulator; radiation tolerant linear regulator; size 45 nm; voltage 1.8 V; CMOS integrated circuits; Logic gates; MESFETs; Regulators; Voltage control; Voltage measurement;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-1136-3
DOI :
10.1109/REDW.2013.6658204
