• DocumentCode
    2149348
  • Title

    Single Event Burnout Observed in Schottky Diodes

  • Author

    George, Jeffrey S. ; Koga, R. ; Moision, Robert M. ; Arroyo, Arturo

  • Author_Institution
    Aerosp. Corp., El Segundo, CA, USA
  • fYear
    2013
  • fDate
    8-12 July 2013
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    We present observations of single event burnout in 200V Schottky diodes used in hybrid DC-DC converters. Two diode types were tested and showed varying sensitivity to heavy ions and protons.
  • Keywords
    DC-DC power convertors; Schottky diodes; radiation effects; Schottky diodes; heavy ions; hybrid DC-DC converter; protons; single event burnout; voltage 200 V; Ions; Protons; Schottky barriers; Schottky diodes; Silicon; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2013 IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4799-1136-3
  • Type

    conf

  • DOI
    10.1109/REDW.2013.6658207
  • Filename
    6658207
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2149348