• DocumentCode
    2149453
  • Title

    Single Event Effect Rate Analysis and Upset Characterization of FPGA Digital Signal Processors

  • Author

    Monreal, Roberto ; Swift, Gary ; Wang, Yi Chun ; Wirthlin, Michael ; Nelson, B.

  • Author_Institution
    Southwest Res. Inst., San Antonio, TX, USA
  • fYear
    2013
  • fDate
    8-12 July 2013
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Charged particle induced upsets in the operation of Digital Signal Processors (DSP) are analyzed for on-orbit upset rate estimates. DSPs embedded in configuration hardened and non-hardened Field Programmable Gate Arrays (FPGA) are both studied for proton and heavy ion effects. The results reinforce the importance on the resulting upset rate of the mathematical fit parameters extracted from the experimental data.
  • Keywords
    digital signal processing chips; field programmable gate arrays; DSP; FPGA; charged particle induced upsets; digital signal processors; field programmable gate arrays; single event effect rate analysis; upset characterization; Digital signal processing; Field programmable gate arrays; Fitting; Ions; Orbits; Protons; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2013 IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4799-1136-3
  • Type

    conf

  • DOI
    10.1109/REDW.2013.6658210
  • Filename
    6658210
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2149453