• DocumentCode
    2149527
  • Title

    Single Event Transient (SET) Susceptibility of the Texas Instruments LM139 Quad Comparator under Proton Irradiation

  • Author

    Gaza, Razvan ; Cooper, Joshua

  • Author_Institution
    IS&GS, Lockheed Martin, Houston, TX, USA
  • fYear
    2013
  • fDate
    8-12 July 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Proton Single Event Transient (SET) data are presented for the Texas Instruments (National Semiconductor) LM139AxQMLV (5962R9673801VxA).
  • Keywords
    Texas Instruments computers; microcomputers; SET susceptibility; Texas Instruments LM139 quad comparator; proton irradiation; proton single event transient data; single event transient susceptibility; Aerospace electronics; Protons; Radiation effects; Single event transients; Space vehicles; Testing; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2013 IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4799-1136-3
  • Type

    conf

  • DOI
    10.1109/REDW.2013.6658213
  • Filename
    6658213
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2149527