Title :
Single-Event Effect Qualification of 24 Bit Analog-to-Digital Converters
Author :
Scheick, Leif Z. ; Allen, G.R. ; Edmonds, Larry D.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
The qualification efforts and results for three 24 bit analog-to-digital converters (ADCs) are presented. These devices demonstrate a noticeable advancement in radiation hardness for the technology with two of the devices exhibiting no Single-Event Latchup.
Keywords :
analogue-digital conversion; ADC; analog-to-digital converters; single-event effect qualification; single-event latchup; Conferences; Laboratories; Propulsion; Radiation effects; Registers; Software;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-1136-3
DOI :
10.1109/REDW.2013.6658215
